Tag Archives: HASS

No Evidence of Correlation: Field failures and Traditional Reliability Engineering

Historically Reliability Engineering of Electronics has been dominated by the belief that 1) The life or percentage of complex hardware failures that occurs over time can be estimated, predicted, or modeled and 2) Reliability of electronic systems can be calculated or estimated through statistical and probabilistic methods to improve hardware reliability.  The amazing thing about this is that during the many decades that reliability Continue reading No Evidence of Correlation: Field failures and Traditional Reliability Engineering