Tag Archives: MIL HNBK 217

The Worst Reliability Requirement

Most of us have seen reliability specified using a requirement like the following:

The Zeus 5000 SUV shall have an MTBF of 144,269.5 miles with a 90% confidence.

Some readers may not have seen reliability requirements specified in any other way.  What they have always seen has read something like:  The widget shall have an MTBF of X with a Y% confidence.  This reliability requirement structure is rather ubiquitous Continue reading The Worst Reliability Requirement

No Evidence of Correlation: Field failures and Traditional Reliability Engineering

Historically Reliability Engineering of Electronics has been dominated by the belief that 1) The life or percentage of complex hardware failures that occurs over time can be estimated, predicted, or modeled and 2) Reliability of electronic systems can be calculated or estimated through statistical and probabilistic methods to improve hardware reliability.  The amazing thing about this is that during the many decades that reliability Continue reading No Evidence of Correlation: Field failures and Traditional Reliability Engineering